M. Kuwahara, A. Mano, Y. Nakagawa, S. Okumi, T. Nakanishi, M. Suzuki, T. Yasue, T. Koshikawa, X. Jin, N. Yamamoto, T. Ujihara, Y. Takeda, M. Yamamoto, T. Ohshima, T. Kohashi, T. Saka, T. Kato, H. Horinaka , Proceedings of 7th International Symposium on Atomic Level Characterizations for New Materials and Devices 09 (頁:84)
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